Metrology for Quality Control

Find the best metrology solutions for quality control, ensuring that measurements are accurate, consistent, and compliant with established standards for improved quality and efficiency. Explore our range of versatile tools.

Automated quality control

Fully-automated Thin Film Quality Control – SENDURO®MEMS

The SENDURO®MEMS is designed for precise and repeatable measurement of film thickness, refractive index, and extinction coefficient of materials relevant to MEMS and sensor fabrication.

Automated Spectroscopic Reflectometer for Quality Control – RM 1000 QC

The RM 1000 QC is designed for fast and easy thickness measurement of transparent and semi-transparent films on patterned wafers for quality control within industrial production processes.

Metrology for Silicon solar cells

Quality Control for Solar Cell Manufacturing – SENperc PV

QC for multi- and c-Si based PERC, HJT, TOPCON, and Perovskites solar cell manufacturing

Laser Ellipsometer – SE 400adv PV

The multiple angle laser ellipsometer SE 400adv PV provides film thickness and refractive index of anti-reflective single films on textured monocrystalline and multicrystalline silicon wafers at the HeNe laser wavelength of 632.8 nm.

Spectroscopic Ellipsometer for Photovoltaics – SER 800 PV

The spectroscopic ellipsometer SER 800 PV is the ideal tool for the analysis of functional and antireflective coatings on textured crystalline silicon solar cells in a R&D environement.

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Explore SENTECH products and applications

Spectroscopic Ellipsometry

Laser Ellipsometer

Spectroscopic Reflectometry

In situ Metrology / Endpoint Detection

News

Optical Reference Data for Technological Layer Systems for novel materials for thin films project (OptiRefS)

Find out more information about the "OptiRefS" collaboration.

The SENTECH Thin Film Metrology Seminar and Workshop 2024

Join us for a cutting-edge thin film metrology seminar and workshop!

Successful Characterisation of Dielectric Layers on SiC for Next-Gen Semiconductor Applications

Explore our latest research and request the full application note.

Wafer-level integration challenges of ALD for 2D materials

Find out about the collaboration between SENTECH and the Ruhr-Universität Bochum (RUB).

Analysing the earth’s heat balance to better understand global warming

The European Space Agency's satellite mission planned for 2027.

The SENTECH “Plasma Process Technology Seminar” 2024

Click here to find out more about the SENTECH Plasma Process Technology Seminar.