Laser Ellipsometer

Explore our cutting-edge Laser Ellipsometer for highest signal to noise ratio in the analysis and characterisation of thin films.

Combined Ellipsometry and Reflectometry CER – SE 500adv

The SE 500adv combines ellipsometry and reflectometry to eliminate the ambiguity of measuring layer thickness of transparent films.

The Multiple Angle Laser Ellipsometer – SE 400adv

The laser ellipsometer SE 400adv measures thickness and refractive index of transparent thin films, featuring measurement speed, Sub-Angstrom precision in thickness, and per mille accuracy in refractive index determination.
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