Experts in thin film metrology
Spectroscopic
ellipsometry
Gain valuable insight into the optical properties of your thin films and surfaces using our non-destructive spectroscopic ellipsometry range of tools.
Laser
ellipsometry
Leverage the unique properties of laser light for high-precision and high-sensitivity measurements of your thin films and surfaces with our laser ellipsometry tools.
Spectroscopic
reflectometry
Determine valuable information about the material properties of your thin films including refractive index and thickness using our durable reflectometry tools.
Metrology
for quality control
Our QC tools ensure the accuracy, reliability, and precision of measurements you need for obtaining accurate data, reproducible results, uniform and consistent measurements for robust and meaningful statistical process control.
In-situ metrology /
endpoint detection
Use our tools to avoid defects or layer damage while increasing time and resource efficiency with uninterrupted real-time measurement, characterisation, and endpoint detection of your materials or processes in their natural environment.
