Spectroscopic Ellipsometry

Versatile and powerful tools that will provide precise and non-destructive characterisation of your thin films and surfaces, an essential tool for understanding and optimising the optical and structural properties of materials.

Spectroscopic Ellipsometer – SENresearch 4.0

The SENresearch 4.0 spectroscopic ellipsometer covers the widest spectral range from 190 nm (deep UV) to 3,500 nm (NIR). High spectral resolution is offered to analyse even thick films up to 200 µm thickness using FTIR ellipsometry.

Cost Effective Spectroscopic Ellipsometer – SENpro

The SENpro is a cost-effective spectroscopic ellipsometer without compromising advanced measurement performance.

Infrared Spectroscopic Ellipsometer with FTIR – SENDIRA

The spectroscopic ellipsometer SENDIRA measures thin film thickness, refractive index, extinction coefficient, and related properties of bulk materials, single layers, and multi-layer stacks.

Spectroscopic Ellipsometry Software – SpectraRay/4

The proprietary SpectraRay/4 SENTECH Spectroscopic Ellipsometry Software, includes data acquisition, modeling, fitting, and extended reporting of ellipsometric, reflection, and transmission data.
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