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Experts in Plasma Process Technology and Thin Film Metrology
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Explore our comprehensive product overview, featuring the latest systems, tools and technologies for low-damage plasma processing and advanced thin film metrology. Find the right solution for your needs.
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Plasma Process Technology​

Discover the reliable, durable, and versatile low-damage plasma etch and deposition systems from SENTECH.​

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Thin Film Metrology

Explore the thin film metrology tools designed to deliver repeatable, consistent, and accurate results.​

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News

Project Mexiquo Team

Revolutionising Photonics: A Path to Affordable, Quantum-Enhanced Optical Components

Learn more about “Projekt MEXSIQUO”
OptiRefS project

OptiRefS Project

Learn more about the OptiRefS project
Delegates from the 2024 SENTECH Thin Film Metrology Seminar and Workshop

The SENTECH Thin Film Metrology Seminar and Workshop 2024

Read about our cutting-edge thin film metrology seminar and workshop!
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Successful Characterisation of Dielectric Layers on SiC for Next-Gen Semiconductor Applications

Explore our latest research and request the full application note.
The RUB Cluster from SENTECH

Wafer-level integration challenges of ALD for 2D materials

Find out about the collaboration between SENTECH and the Ruhr-Universität Bochum (RUB).
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Analysing the earth’s heat balance to better understand global warming

The European Space Agency's satellite mission planned for 2027.