The SENTECH Thin Film Metrology Seminar and Workshop

Read the full article to find out more about the seminar.

The SENTECH Thin Film Metrology Seminar and Workshop took place on 29 -30 November 2023, at the SENTECH Campus in Berlin-Adlershof. Our invited speakers shared the latest, fascinating application-based research results with our delegates from the international metrology community.

Invited expert speakers from both research & development and industry were in attendance to give presentations on topics including the analysis of anisotropic materials and 2D structures, the latest developments in monitoring of optical coatings and microsensors, characterisation of ALD heterostructures, quality control on SiC, Si and transparent substrates, and in device packaging, plus many more topics.

In addition to the seminar on day one, day two featured a workshop covering an introduction to ellipsometry through to more advanced use cases. Experts from the SENTECH Metrology Application Team worked with delegates on individual use cases, to discuss the challenges and solutions for their non-confidential applications.

SENTECH held a roundtable dinner event where our delegates, expert speakers, and, members of the SENTECH team had the opportunity to network in an informal atmosphere while enjoying a great meal.

SENTECH would like to thank all of our invited speakers for their contributions to the agenda and all of the delegates for their attention, questions, and, insightful discussion.

If you would like to find out further information regarding the SENTECH Thin Film Metrology Seminar and Workshop, please email To take a look at the agenda from the event please click on the link below.

Programm SENTECH Messtechnik Seminar und Workshop 2023