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SENTECH - Erfolg durch Leistung
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Plasma Process Technology
Plasma Etching
Plasma Etching
  • ICP-RIE SI 500
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PECVD
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Atomic Layer Deposition
Atomic Layer Deposition
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Cluster Configuration
Cluster Configuration
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Spectroscopic Ellipsometry
Spectroscopic Ellipsometry
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Laser Ellipsometer
  • SE 400adv
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Spectroscopic Reflectometry
Spectroscopic Reflectometry
  • RM 1000 / 2000
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Metrology for Photovoltaics
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Silicon solar cells
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Thin Film Solar Cells
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