SENTCH’s dedication to a broad application range for our spectroscopic ellipsometers gave rise to the new 2C-option for Müller Matrix Measurements. This smart option enables SENTECH spectroscopic ellipsometers SENresearch to measure all 16 Mueller Matrix elements with an accuracy of +/- 0.005.
SENTECH as a worldwide leader in thin film measurement and plasma process technology organizes application oriented seminars on a regular basis. The most recent seminar “Ellipsometry and Reflectometry for characterizing thin films” was on thin film measurement. →read more