Thin film measurement Seminar

SENTECH experts in thin film measurement kindly invite you to our annual seminar “Ellipsometry and Reflectometry for characterizing thin films” at the Commundo-Tagungshotel Stuttgart/ University Campus of Stuttgart on June 18th, 2015. Focus of this seminar will be on spectroscopic ellipsometry and reflectometry for the analysis of thin films. →read more

ICP-RIE Plasma Etching:

Plasma_cryogenicSiPlasma_lithographyPlasma etching result of VCSEL structure using Ar-Cl2 gas mixtureEtching process result of Si-DRIE (SF6-C4F8-O2) post O2 cleanPlasma etching result of SF6-C4F8 based gas chopping process(IAP-Jena)ICP PECVD TEOS SiO2 film step coverage over Si ridge(IISB-Erlangen)ICP RIE result of SF6O2-C4F8-based Si gas chopping process

Upcoming Events:

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SENTECH
Instruments GmbH

Schwarzschildstr. 2
12489 Berlin
Germany

Phone: +49 (0)30 63 92 55 20
Fax: +49 (0)30 63 92 55 22
Email: info@sentech.de



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