Innovation, Insights, and Hands-On Discovery
The SENTECH Thin Film Metrology Workshop 2025, held on 15–16 October 2025 at SENTECH Instruments GmbH in Adlershof-Berlin, has wrapped up for 2025!
Over two informative days, participants from research institutions, universities, and industry came together to explore the power of 椭偏仪, transmission, and 反射测量, and to experience first-hand how these techniques advance thin film measurement and characterisation.
A Dynamic and Engaging Workshop
With the motto Explore – Learn – Apply, this year’s workshop offered a rich combination of interactive lectures, live demonstrations, and hands-on sessions. Attendees were invited to bring their own non-confidential thin film samples, working directly with the SENTECH application and development experts to investigate real-world challenges and refine their measurement techniques.
The atmosphere was lively and collaborative, with participants exchanging ideas, discussing advanced modelling strategies, and sharing insights from their own research and production experiences.
Workshop Highlights
The program was packed with technical topics and practical research. Key highlights included:
- Interactive lectures led by SENTECH’s experts, offering both foundational and advanced insights into thin film metrology.
- Live demonstrations of the powerful SpectraRay/4 software, showcasing the latest in ellipsometric data analysis.
- Hands-on practical sessions, where attendees applied measurement and modelling techniques directly to their own samples.
- Networking opportunities, including a hosted dinner that fostered collaboration and connection among participants.
Topics That Inspired and Informed
Throughout the two days, attendees explored a full spectrum of metrology topics, from theory to advanced applications:
- Fundamentals and practical introduction
- Advanced modelling techniques
- Script programming for ellipsometry
- Real-world applications and complex analysis
- Depolarisation and non-idealities
- Mueller matrix and scatterometry
- Ellipsometry with transmission and reflectometry
Each session built upon the last, giving participants a comprehensive understanding of thin film metrology, while providing the tools and confidence to apply what they learned in their own labs and projects.
Behind the Scenes at SENTECH
Participants had access to SENTECH’s state-of-the-art thin film metrology laboratories, offering a behind-the-scenes look at the innovative technologies driving SENTECH’s research and product development.
A Community of Collaboration
One of the workshop’s most rewarding aspects was the enthusiasm of its participants. Delegates worked side by side, testing techniques, sharing results, and learning from each other’s expertise. The collaborative spirit was evident throughout the event, reflecting the shared goal of advancing thin film metrology as a discipline and practice.
Looking Ahead
The success of this year’s workshop highlights the continued interest in advanced metrology solutions and reinforces SENTECH’s commitment to supporting innovation and education in this field.
SENTECH extends heartfelt thanks to all participants, speakers, and organisers who made the event such a valuable experience. We look forward to welcoming everyone again at the next SENTECH Thin Film Metrology Workshop. If you were unable to attend this year’s event in person and would like to know more about the SENTECH spectroscopic ellipsometry, laser ellipsometry, spectroscopic reflectometry, thin film quality control, and in-situ thin film metrology systems, please contact sales@sentech.de.
