新闻

Read about the latest company news and product developments from SENTECH.

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Attendees of the SENTECH Thin Film Metrology Workshop 2025

Success at the SENTECH Thin Film Metrology Workshop 2025

The power of ellipsometry, transmission, and reflectometry, learn more
LAAS_CNRS clean room visit

SENTECH at EUROnanoLAB 2025 CVD & ALD Workshop

Learn more about our recent visit
Thin film metrology application training

Empowering Research with our partners: Thin Film Metrology Application Training in Warsaw, Poland

SENTECH application training in Poland
SENTECH SI PEALD with PTSA ICP Source

A New Level of Configurability, the SENTECH SI PEALD System with ICP Source

Learn more about the SENTECH SI PEALD System with ICP Source
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SENTECH Instruments and PVA TePla Join Forces to Expand Semiconductor Metrology Portfolio

Read about this exciting collaboration
SENTECH SENresearch 4.0 Spectroscopic Ellipsometer

SENTECH Thin Film Metrology Workshop

Register today to guarantee your place at the event!
Dr. Marcel Schulze and Mr. Friedrich P. Witek

森泰克领导层公告

宣布加强领导团队
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全球合作在行动!

2025 年 SENTECH 经销商会议
Photo of delegates attending the 2025 SENTECH Plasma Seminar

SENTECH 2025 年等离子工艺技术研讨会

A full event recap!
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纪念赫尔穆特-维泰克博士的生平和遗产

Project Mexiquo Team

革新光子学:通向经济实惠的量子增强型光学元件之路

了解更多关于 "Projekt MEXSIQUO "的信息
OptiRefS project

OptiRefS 项目

了解有关 OptiRefS 项目的更多信息
Delegates from the 2024 SENTECH Thin Film Metrology Seminar and Workshop

2024 年森泰克薄膜计量研讨会和讲习班

了解我们的尖端薄膜计量研讨会和讲习班!
SENDURO accuva 10

为下一代半导体应用成功表征碳化硅介质层

了解我们的最新研究,并索取完整的应用说明。
The RUB Cluster from SENTECH

二维材料 ALD 在晶圆级集成方面的挑战

了解SENTECH与波鸿鲁尔大学(RUB)之间的合作。
Image of cleanroom - Copyright Fraunhofer IOF

分析地球热平衡,更好地了解全球变暖

The European Space Agency's satellite mission planned for 2027.
SENTECH Plasma Seminar 2024

2024 年森泰克 "等离子工艺技术研讨会

点击此处了解更多关于 SENTECH 等离子工艺技术研讨会的信息。