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新闻

Attendees of the SENTECH Thin Film Metrology Workshop 2025

Success at the SENTECH Thin Film Metrology Workshop 2025

The power of ellipsometry, transmission, and reflectometry, learn more
LAAS_CNRS clean room visit

SENTECH at EUROnanoLAB 2025 CVD & ALD Workshop

Learn more about our recent visit
Thin film metrology application training

Empowering Research with our partners: Thin Film Metrology Application Training in Warsaw, Poland

SENTECH application training in Poland
SENTECH SI PEALD with PTSA ICP Source

A New Level of Configurability, the SENTECH SI PEALD System with ICP Source

Learn more about the SENTECH SI PEALD System with ICP Source
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SENTECH Instruments and PVA TePla Join Forces to Expand Semiconductor Metrology Portfolio

Read about this exciting collaboration
SENTECH SENresearch 4.0 Spectroscopic Ellipsometer

SENTECH Thin Film Metrology Workshop

Register today to guarantee your place at the event!