Skip to content
Dekoratives Bild
  • Products
        • Plasma Process Technology

        • Plasma Process Technology

          Low-damage plasma etch and deposition systems from SENTECH
        • Plasma Etching
        • ICPECVD Systems
        • Atomic Layer Deposition Systems
        • Cluster Configuration for Plasma Etching and Deposition
        • Thin Film Metrology

        • Thin Film Metrology

          SENTECH thin film metrology tools for repeatable and accurate results
        • Metrology for Quality Control
        • Spectroscopic Ellipsometry
        • Spectroscopic Reflectometry
        • Laser Ellipsometry
        • In-situ Metrology / Endpoint Detection
  • Application and Industries
        • Application and Industries

          Leading-edge application capabilities from SENTECH
        • Optoelectronics
        • MEMS
        • Sensors
        • Power Devices
        • Quality Control
  • Company
        • Company

          About SENTECH, news and events
        • About SENTECH
        • News
        • Events
  • Careers
  • Customer Support
        • Customer Support

          SENTECH Sales, Application and Technical Service support
        • Worldwide Sales Network
        • Application Support
        • Technical Service Support
Contact

Technischer Zeichner/-in (Plasma-Prozess-Technologie) (m/w/d)

Dekoratives Bild
Dekoratives Bild
Plasma Process Technology
  • Plasma Etching
  • ICPECVD Systems
  • Atomic Layer Deposition
  • Cluster Configuration
  • Plasma Etching
  • ICPECVD Systems
  • Atomic Layer Deposition
  • Cluster Configuration
  • Plasma Etching
  • ICPECVD Systems
  • Atomic Layer Deposition
  • Cluster Configuration
  • Plasma Etching
  • ICPECVD Systems
  • Atomic Layer Deposition
  • Cluster Configuration
Thin Film Metrology
  • Spectroscopic Reflectometry
  • Laser Ellipsometry
  • Spectroscopic Ellipsometry
  • Metrology for Quality Control
  • In-situ Metrology
  • Spectroscopic Reflectometry
  • Laser Ellipsometry
  • Spectroscopic Ellipsometry
  • Metrology for Quality Control
  • In-situ Metrology
  • Spectroscopic Reflectometry
  • Laser Ellipsometry
  • Spectroscopic Ellipsometry
  • Metrology for Quality Control
  • In-situ Metrology
  • Spectroscopic Reflectometry
  • Laser Ellipsometry
  • Spectroscopic Ellipsometry
  • Metrology for Quality Control
  • In-situ Metrology
Application and Industries
  • Optoelectronics
  • MEMS
  • Sensors
  • Power Devices
  • Quality Control
  • Optoelectronics
  • MEMS
  • Sensors
  • Power Devices
  • Quality Control
  • Optoelectronics
  • MEMS
  • Sensors
  • Power Devices
  • Quality Control
  • Optoelectronics
  • MEMS
  • Sensors
  • Power Devices
  • Quality Control
Linkedin
  • About SENTECH
  • Careers
  • News
  • Events
  • Contact
  • About SENTECH
  • Careers
  • News
  • Events
  • Contact
  • About SENTECH
  • Careers
  • News
  • Events
  • Contact
  • About SENTECH
  • Careers
  • News
  • Events
  • Contact
  • Worldwide Sales Network
  • Application Support
  • Technical Service Support
  • Worldwide Sales Network
  • Application Support
  • Technical Service Support
  • Worldwide Sales Network
  • Application Support
  • Technical Service Support
  • Worldwide Sales Network
  • Application Support
  • Technical Service Support
Dekoratives Bild
Dekoratives Bild
© 2006 - 2025 SENTECH Instruments GmbH - All rights reserved.
  • Imprint
  • Legal information
  • Privacy
  • Cookies settings
  • Imprint
  • Legal information
  • Privacy
  • Cookies settings