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Products
Plasma Process Technology
Plasma Process Technology
Low-damage plasma etch and deposition systems from SENTECH
Plasma Etching
ICPECVD Systems
Atomic Layer Deposition Systems
Cluster Configuration for Plasma Etching and Deposition
Thin Film Metrology
Thin Film Metrology
SENTECH thin film metrology tools for repeatable and accurate results
Metrology for Quality Control
Spectroscopic Ellipsometry
Spectroscopic Reflectometry
Laser Ellipsometry
In-situ Metrology / Endpoint Detection
Application and Industries
Application and Industries
Leading-edge application capabilities from SENTECH
Optoelectronics
MEMS
Sensors
Power Devices
Quality Control
Company
Company
About SENTECH, news and events
About SENTECH
News
Events
Careers
Customer Support
Customer Support
SENTECH Sales, Application and Technical Service support
Worldwide Sales Network
Application Support
Technical Service Support
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