Spectroscopic Reflectometry

Spectroscopic reflectometers, for fast and accurate, flexible measurement of thin films with small spot size and options to fit your application needs.
Dekoratives Bild
Dekoratives Bild

Sprectrscopic Ellipsometry

What are the advantages of spectroscopic ellipsometry?

Spectroscopic ellipsometry is a powerful technique for thin-film and ultra-thin film measurement due to its non-destructive, highly precise, and versatile nature. It measures the change in polarisation of light as it reflects off a thin film, providing detailed information about the film’s thickness, refractive index, and optical properties across a wide spectral range.

SENTECH RM 1000/2000

The Spectroscopic Reflectometery Tools – RM 1000 and RM 2000

The spectroscopic reflectometer RM 1000/2000 features UV to NIR spectral range from 200 nm – […]
SENTECH FTPadv

Film Thickness Probe – FTPadv

The FTPadv is a cost-effective table top solution for spectroscopic reflectometry which features rapid thickness […]
FTPadv Expert

Comprehensive Thin Film Measurement Software – FTPadv Expert

The spectroscopic reflectometry software FTPadv Expert is especially designed for measuring and analysing R(λ) and […]
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