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Thin Film Metrology
SENTECH thin film metrology tools for repeatable and accurate results
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Thin Film Metrology
Spectroscopic Reflectometry
Spectroscopic reflectometry, for fast and accurate, flexible measurement of thin films with small spot size and options to fit your application needs.
Sprectrscopic Reflectometry
The Spectroscopic Reflectometery Tools –
RM 1000
and
RM 2000
The spectroscopic reflectometry using the
RM 1000
/2000
features UV to NIR spectral range from 200 […]
Film Thickness Probe – FTPadv
The FTPadv is a cost-effective table top solution for spectroscopic reflectometry which features rapid thickness […]
Comprehensive Thin Film Measurement Software –
FTPadv Expert
The spectroscopic reflectometry software
FTPadv Expert
is especially designed for measuring and analysing R(λ) and […]
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Explore SENTECH products and applications
Spectroscopic Ellipsometry
Laser Ellipsometer
Metrology for quality control
In situ Metrology / Endpoint Detection
News
Revolutionising Photonics: A Path to Affordable, Quantum-Enhanced Optical Components
Learn more about “Projekt MEXSIQUO”
OptiRefS Project
Learn more about the OptiRefS project
The SENTECH Thin Film Metrology Seminar and Workshop 2024
Read about our cutting-edge thin film metrology seminar and workshop!
Successful Characterisation of Dielectric Layers on SiC for Next-Gen Semiconductor Applications
Explore our latest research and request the full application note.
Wafer-level integration challenges of ALD for 2D materials
Find out about the collaboration between SENTECH and the Ruhr-Universität Bochum (RUB).
Analysing the earth’s heat balance to better understand global warming
The European Space Agency's satellite mission planned for 2027.
