Spectroscopic Ellipsometry
When is it the ideal choice?
It is precise, versatile, and non-destructive. Unlike conventional techniques, it analyses the change in light polarisation across a broad spectrum. One of the biggest advantages is its ability to measure ultra-thin films, down to sub-nanometer levels, its handling of multilayer structures without disturbing the sample and is particularly powerful for its ability to use a wide range of wavelengths.
