Spectroscopic Ellipsometry

Versatile and powerful tools that will provide precise and non-destructive characterisation of your thin films and surfaces, an essential tool for understanding and optimising the optical and structural properties of materials.
Dekoratives Bild
Dekoratives Bild

Spectroscopic Ellipsometry

When is spectroscopic ellipsometry the ideal choice?

Spectroscopic ellipsometry is precise, versatile, and non-destructive. Unlike conventional techniques, spectroscopic ellipsometry analyses the change in light polarisation across a broad spectrum. One of the biggest advantages is its ability to measure ultra-thin films, down to sub-nanometer levels, its handling of multilayer structures without disturbing the sample.

Spectroscopic ellipsometry is particularly powerful for its ability to use a wide range of wavelengths.

SENTECH SENresearch 4.0

Spectroscopic Ellipsometer – SENresearch 4.0

The SENresearch 4.0 spectroscopic ellipsometer covers the widest spectral range from 190 nm (deep UV) […]
SENTECH SENpro Spectroscopic Ellipsometer

Cost Effective Spectroscopic Ellipsometer – SENpro

The SENpro is a cost-effective spectroscopic ellipsometer without compromising advanced measurement performance. […]
SENTECH SENDIRA

Infrared Spectroscopic Ellipsometer with FTIR – SENDIRA

The spectroscopic ellipsometer SENDIRA measures thin film thickness, refractive index, extinction coefficient, and related properties […]
SENTECH SpectraRay/4 Software

Spectroscopic Ellipsometry Software – SpectraRay/4

The proprietary SpectraRay/4 SENTECH Spectroscopic Ellipsometry Software, includes data acquisition, modeling, fitting, and extended reporting […]
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