Spectroscopic Ellipsometry
When is it the ideal choice?
Spectroscopic ellipsometry stands out as a powerhouse in advanced material analysis, offering unmatched advantages over other ellipsometry techniques. Unlike single-wavelength or laser-based methods, it captures a broad spectrum of wavelengths at once, unlocking detailed insights into optical properties like refractive index, extinction coefficient, and thickness. This broad-spectrum capability makes it a go-to tool for characterising multilayer thin films, complex materials, and anisotropic surfaces with precision. It excels in distinguishing materials with similar optical properties by analysing their spectral signatures, making it invaluable for multilayer and heterogeneous systems. characterisation, cementing its role as an indispensable tool in modern science and engineering.
Plus, it’s non-destructive, preserving the integrity of samples while delivering accurate results. Its ultra-sensitivity to subtle changes in optical properties makes it essential for critical applications in semiconductors, photovoltaics, and coatings. Advanced modeling further enhances its ability to analyse rough, textured, or graded layers with ease. Combining versatility, precision, and non-invasiveness, spectroscopic ellipsometry redefines material
