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Metrology for Quality Control

Find the best metrology solutions for quality control, ensuring that measurements are accurate, consistent, and compliant with established standards for improved quality and efficiency. Explore our range of versatile tools.
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Metrology for Quality Control

What is the importance of quality control?

Quality control is crucial in microtechnology applications because it ensures the reliability, precision, and performance of devices that operate at extremely small scales, such as semiconductors, sensors, and microelectromechanical systems (MEMS). Even the slightest defect in micro-scale components can lead to significant malfunctions, impacting device functionality or causing total failure. At SENTECH we offer a range of systems that can be used in research and industry.

Automated Quality Control

SENDURO MEMS

Fully Automated Thin Film Quality Control – SENDURO®MEMS

The SENDURO®MEMS is designed for fully automated, precise and repeatable measurement of film thickness, refractive […]
SENTECH RM 1000 QC Spectroscopic Reflectomer

Automated Spectroscopic Reflectometer for Quality Control – RM 1000 QC

The RM 1000 QC is designed for fast and easy thickness measurement of transparent and […]

Metrology for Silicon Solar Cells

SENTECH SENperc

Quality Control for Solar Cell Manufacturing – SENperc PV

QC for multi- and c-Si based PERC, HJT, TOPCON, and Perovskites solar cell manufacturing […]
Multi-angle Laser Ellipsometer - SE 400adv PV

Multi-Angle Laser Ellipsometer – SE 400adv PV

The multi-angle laser ellipsometer SE 400adv PV provides film thickness and refractive index of anti-reflective […]
SENTECH SER 800 PV

Spectroscopic Ellipsometer for Photovoltaics – SER 800 PV

The spectroscopic ellipsometer SER 800 PV is the ideal tool for the analysis of functional […]
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Spectroscopic Ellipsometry

Laser Ellipsometer

Spectroscopic Reflectometry

In situ Metrology / Endpoint Detection

News

Project Mexiquo Team

Revolutionising Photonics: A Path to Affordable, Quantum-Enhanced Optical Components

Learn more about “Projekt MEXSIQUO”
OptiRefS project

OptiRefS Project

Learn more about the OptiRefS project
Delegates from the 2024 SENTECH Thin Film Metrology Seminar and Workshop

The SENTECH Thin Film Metrology Seminar and Workshop 2024

Read about our cutting-edge thin film metrology seminar and workshop!
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Successful Characterisation of Dielectric Layers on SiC for Next-Gen Semiconductor Applications

Explore our latest research and request the full application note.
The RUB Cluster from SENTECH

Wafer-level integration challenges of ALD for 2D materials

Find out about the collaboration between SENTECH and the Ruhr-Universität Bochum (RUB).
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Analysing the earth’s heat balance to better understand global warming

The European Space Agency's satellite mission planned for 2027.