Laser Ellipsometry

Explore our cutting-edge Laser Ellipsometer for highest signal to noise ratio in the analysis and characterisation of thin films.
Dekoratives Bild
Dekoratives Bild

Laser Ellipsometry

When is laser ellipsometry the right solution?

Laser ellipsometry is highly effective for thin film measurement due to its precision, non-destructive nature, and ability to probe very thin layers with extreme accuracy. One of the key strengths of laser ellipsometry is its high sensitivity to ultra-thin films, including those with thicknesses down to a few angstroms.

SENTECH SE 400adv

SE 400adv Multiple-Angle Laser Ellipsometer

The laser ellipsometer SE 400adv measures thickness and refractive index of transparent thin films, featuring […]
SENTECH SE 500adv

SE 500adv Combined Ellipsometry Reflectometry

The SE 500adv combines ellipsometry and reflectometry to eliminate the ambiguity of measuring layer thickness […]
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