Laser Ellipsometry

Explore our cutting-edge Laser Ellipsometer for highest signal to noise ratio in the analysis and characterisation of thin films.
Dekoratives Bild
Dekoratives Bild

Laser Ellipsometry

When is laser ellipsometry the right solution?

Laser ellipsometry is highly effective for thin film measurement due to its precision, non-destructive nature, and ability to probe very thin layers with extreme accuracy. One of the key strengths of laser ellipsometry is its high sensitivity to ultra-thin films, including those with thicknesses down to a few angstroms.

SENTECH SE 500adv

Combined Ellipsometry and Reflectometry CER – SE 500adv

The SE 500adv combines ellipsometry and reflectometry to eliminate the ambiguity of measuring layer thickness […]
SENTECH SE 400adv

The Multiple Angle Laser Ellipsometer – SE 400adv

The laser ellipsometer SE 400adv measures thickness and refractive index of transparent thin films, featuring […]
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