SENTECH Instruments GmbH is proud to announce a strategic cooperation with PVA TePla AG, a leading provider of high-tech solutions in the fields of materials and metrology technology.
This collaboration marks a significant step forward in enhancing our capabilities in semiconductor metrology, one of the fastest-growing segments of the global technology market.
A Shared Vision for Growth and Innovation
The cooperation focuses on jointly developing non-destructive optical measurement systems for the analysis of thickness and homogeneity of thin-film coatings, which is a critical parameter in semiconductor production. It combines the SENTECH advanced optical metrology technologies with PVA TePla’s technological platform, production capabilities, and sales network to develop a solution that will support manufacturers in maintaining stringent quality standards while improving efficiency and reducing waste. Our proven expertise in non-destructive measurement methods will contribute to the development of innovative solutions that meet the high-precision demands of modern semiconductor manufacturing.
Strengthening the Semiconductor Value Chain
As semiconductor devices continue to evolve, the demand for high-resolution, non-contact metrology tools grows in parallel. Our collaboration with PVA TePla aligns with this trend and reflects our mutual commitment to delivering forward-thinking, customer-centric solutions.
Through this cooperation, SENTECH not only strengthens its role as a technology leader in optical metrology but also contributes to building a more robust, future-ready semiconductor ecosystem
Learn More
For further details on this cooperation, read the official press release on the PVA TePla website.
