This week, our Thin Film Metrology team was on-site in Warsaw, Poland, delivering advanced application training and technical support for one of our valued customers. The visit was carried out in close collaboration with Labsoft, our trusted sales and service partner in Poland.
In industries such as materials research, nanotechnology, and microfabrication, precise thin film measurement is vital for success. That’s why, when you invest in one of our cutting-edge ellipsometry or reflectometry systems or a hybrid metrology solution, you gain more than advanced instrumentation. You gain a dedicated team of experts committed to supporting you throughout the entire lifetime of your system.
Our thin film metrology specialists work closely with customers to ensure every measurement is accurate, repeatable, and traceable, providing confidence and reliability in both R&D and production environments. From thin film characterisation and process control to quality assurance, our ellipsometers and reflectometers enable users to achieve higher levels of measurement precision and consistency.
By combining innovative ellipsometry and reflectometry technologies, our systems help bridge the gap between research and manufacturing, ensuring data you can trust for every application.
Interested in discovering how our Thin Film Metrology systems can enhance your measurement precision and performance?
