News

Read about the latest company news and product developments from SENTECH.

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SENTECH Plasma Process Technology Seminar 2026 – Save the Date!

The SENTECH Plasma Seminar returns in 2026, dates now confirmed
SiC for power devices

Processing Silicon Carbide (SiC), Understanding the Challenges and Finding Pathways to Precision

Read our latest article about SiC processing and characterisation
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SENTECH Instruments and PVA TePla Launch Next-Generation LuXpector THEA at SEMICON Europa 2025

Learn more about the LuXpector THEA
SI 500 ALE

Understanding ALE, When is Atomic Layer Etching the answer?

Read our latest article about atomic layer etching
Attendees of the SENTECH Thin Film Metrology Workshop 2025

Success at the SENTECH Thin Film Metrology Workshop 2025

The power of ellipsometry, transmission, and reflectometry, learn more
LAAS_CNRS clean room visit

SENTECH at EUROnanoLAB 2025 CVD & ALD Workshop

Learn more about our recent visit
Thin film metrology application training

Empowering Research with our partners: Thin Film Metrology Application Training in Warsaw, Poland

SENTECH application training in Poland
SENTECH SI PEALD with PTSA ICP Source

A New Level of Configurability, the SENTECH SI PEALD System with ICP Source

Learn more about the SENTECH SI PEALD System with ICP Source
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SENTECH Instruments and PVA TePla Join Forces to Expand Semiconductor Metrology Portfolio

Read about this exciting collaboration
SENTECH SENresearch 4.0 Spectroscopic Ellipsometer

SENTECH Thin Film Metrology Workshop

Register today to guarantee your place at the event!
Dr. Marcel Schulze and Mr. Friedrich P. Witek

Leadership Announcement at SENTECH

Strengthened leadership team announced
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Global Collaboration in Action!

SENTECH Distributor Meeting 2025
Photo of delegates attending the 2025 SENTECH Plasma Seminar

SENTECH Plasma Process Technology Seminar 2025

A full event recap!
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Honouring the Life and Legacy of Dr. Helmut Witek

Project Mexiquo Team

Revolutionising Photonics: A Path to Affordable, Quantum-Enhanced Optical Components

Learn more about “Projekt MEXSIQUO”
OptiRefS project

OptiRefS Project

Learn more about the OptiRefS project
Delegates from the 2024 SENTECH Thin Film Metrology Seminar and Workshop

The SENTECH Thin Film Metrology Seminar and Workshop 2024

Read about our cutting-edge thin film metrology seminar and workshop!
SENDURO accuva 10

Successful Characterisation of Dielectric Layers on SiC for Next-Gen Semiconductor Applications

Explore our latest research and request the full application note.
The RUB Cluster from SENTECH

Wafer-level integration challenges of ALD for 2D materials

Find out about the collaboration between SENTECH and the Ruhr-Universität Bochum (RUB).
Image of cleanroom - Copyright Fraunhofer IOF

Analysing the earth’s heat balance to better understand global warming

The European Space Agency's satellite mission planned for 2027.