Register your place at the Thin Film Metrology Seminar in association with Labsoft and SENTECH 13-14 June 2023

ACMIN_Thin-Film_ Metrology_ Seminar_2023

SENTECH is delighted to be supporting this year’s Thin Film Metrology Seminar in association with Labsoft on 13-14 June 2023, to be held in ACMIN AGH, Cracow, Poland.

The main purpose of the seminar is to examine the latest advances in ellipsometry and other key technologies with application-based research results available to the thin-layer researcher community and create a networking opportunity for discussion and ideas in this evolving area of scientific analysis and ellipsometry measurements.

Invited expert speakers from both research & development and industrial science will be in attendance to give presentations on topics including integrated photonic sensors and temperature-dependent spectroscopic ellipsometry of thin polymer films.

Each session will share, current challenges, and solutions for working with some of today’s leading-edge applications including sensor and photonic technologies, photovoltaics, or organic electronics. We look forward to sharing a full agenda soon.

In addition to the presentations, experts from the SENTECH Metrology Application Team will be on-hand to work with delegates’ individual applications.

The seminar cost is 800 PLN plus taxes per delegate, and spaces are limited so will be allocated on a first-come-first-served basis. To find out more information, contact

PhD Marta Izydorzak-Woźniak

M: (+48) 667 617 428


Or you can simply register here

To look at the full agenda for the event please click here:  Thin Film Metrology Seminar Agenda 2023 .