Berlin, 18.05.2015

SENTECH Seminar Ellipsometry & Reflectometry for characterizing thin films

Thin film measurement Seminar

(SENTECH Seminar on "Ellipsometry and Reflectometry for characterizing thin films 2014")

SENTECH experts in thin film measurement kindly invite you to our annual seminar “Ellipsometry and Reflectometry for characterizing thin films”.

Focus of this seminar will be on spectroscopic ellipsometry and reflectometry for the analysis of thin films. The contributions of external experts from research and industry, e.g. on cryo ellipsometry and on quality control of PERC cells will be particularly interesting.

SENTECH experts will give presentations on our recent developments. SENDURO® MEMS is the solution to automated process control in MEMS and sensor manufacturing. Furthermore there will be a presentation on in situ process optimization with the new ALD Real Time Monitor. Download the full Program here.

This application oriented event will take place at the Commundo-Tagungshotel Stuttgart/ University Campus of Stuttgart on June 18th, 2015. The talks will be given in German. After the contributions, you are kindly invited to a demonstration of SENTECH ellipsometers and reflectometers in the application lab.

Please register for the seminar at using our Registration as soon as possible, as the number of participants is limited to 30. Attendance fee: 180,00 € incl. VAT.

Hotel bookings in the Commundo Hotel are possible upon request. For further questions please contact SENTECH via telephone: +49 89 897 9607-0.