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SENTECH Seminar & Workshop Ellipsometry and Reflectometry
Nov 06, 2018 - Nov 07, 2018
Berlin Adlershof, Germany

An application oriented seminar on the topic ellipsometry and reflectometry for quality control and a workshop on the Spectroscopic Ellipsometry Software SpectraRay/4 is organized by SENTECH on November 6th and 7th, 2018 at SENTECH headquarter (address: Schwarzschildstr. 2, Berlin, Adlershof) .

The seminar will take place on day one and it will cover topics like new developments of our optical thin-film metrology e.g. in photovoltaics, to optimize ALD processes using in-situ ellipsometry. SENTECH experst as well as our customers will share their knowledge and experiences.

The workshop on day two is all about our innovative spectroscopic ellipsometry software SpectraRay/4 and its applications. More information on this event as well as all registration documents are available here.