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Plasma Process Technology
Plasma Process Technology
Low-damage plasma etch and deposition systems from SENTECH
Plasma Etching
ICPECVD Systems
Atomic Layer Deposition Systems
Cluster Configuration for Plasma Etching and Deposition
Thin Film Metrology
Thin Film Metrology
SENTECH thin film metrology tools for repeatable and accurate results
Metrology for Quality Control
Spectroscopic Ellipsometry
Spectroscopic Reflectometry
Laser Ellipsometry
In-situ Metrology / Endpoint Detection
Application and Industries
Application and Industries
Leading-edge application capabilities from SENTECH
Optoelectronics
MEMS
Sensors
Power Devices
Quality Control
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Company
About SENTECH, news and events
About SENTECH
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Customer Support
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Learn about our company and the team behind the Thin Film Metrology and Plasma Processing solutions. Discover our mission, values, and expertise, with a commitment to providing the best tools and services for your applications.
