Ellipsometers, Reflectometers
Spectroscopic Ellipsometers
SENresearch - UV-VIS-NIR spectroscopic ellipsometer family
SENDIRA - FT-IR ellipsometer
SENpro - cost effective spectroscopic ellipsometer
Laser Ellipsometers and CER
SE 400adv - multiple angle laser ellipsometer
SE 500adv - combined ellipsometry and reflectometry CER
LaserPro - most cost effective laser ellipsometer
SE 800 GS - automated spectroscopic ellipsometer for layers on large glass panels
Measures: Thickness of single films and layer stacks, optical constants
FTPadvanced Inline - manual mapping table to characterize thin films on glass by relfectometry and sheet resistance measurement (4-point probe sensor or non-contact Eddy current sensor)
SE 400adv PV - measures thickness and refractive index of anti-reflection coatings on textured multicrystalline and monocrystalline solar cells
SE 800 PV - Spectroscopic Elliposmeter for the analysis of single films and layer stacks on monocrystalline and multicrystalline silicon solar cells
RM 1000 - Reflectometer for the measurement of thickness of antireflective films on monocrystalline and multicrystalline silicon solar cells
FTPadv Inline - Inline measurement system for film thickness analysis of thin film solar cells by reflectometry
Number of sensor heads: maximal 7
SenSol M - manual measurement system for thin film solar cells with multiple sensor platform
Panel size: 1.1 m x 1.6 m, 1.1 m x 1.4 m, others on request
Sensors for:
- Reflection measurements on smooth and rough films
- Non-contact sheet resistance measurement (Eddy current method)
- 4-point probe sheet resistance measurement
SenSol H - horizontally configured, computer controlled mapping system for thin film solar cells with multiple sensor platform
Panel size: 1.1 m x 1.6 m, 1.1 m x 1.4 m, others on request
Sensors for:
- reflection measurements on smooth and rough films
- transmission measurements on smooth and rough films
- non-contact sheet resistance measurement (eddy current method)
- 4-point probe sheet resistance measurement
SenSol V - vertically configured, computer controlled mapping system for thin film solar cells with fixed multiple sensor platform
Panel size: 1.1 m x 1.6 m, 1.1 m x 1.4 m, others on request
Sensors for:
- reflection measurements on smooth and rough films
- transmission measurements on smooth and rough films
- non-contact sheet resistance measurement (eddy current method)
- 4-point probe sheet resistance measurement