FTPadv Inline
Reflection measurement system for the inline monitoring of the thickness of films on thin film solar cells
The FTPadv Inline monitors thickness and reflectivity of films on thin film solar cells. TCO -, absorber - and buffer layers can be analyzed.
The FTPadv Inline can be installed in a production line and used to monitor the uniformity of deposition processes. The measurement sensors are operated in the specular reflection mode. Seven sensors can be driven by one controller which provides a cost effective solution for uniformity monitoring. A high measurement speed for multiple point measurements is provided by optimized operation including referencing for reflection measurements, channel switching and light processing.
Specifications:
| Spectral range | 430 - 930 nm |
| Spot size | 2 mm |
| Light source | Tungsten Halogen lamp |
| Number of sensors | 1...7 |
| Sensor dimensions | diameter: 500 mm, height: 100 mm |
| Distance between sensor and controller | typical 4 m, others on request |
Please see also specs of FTPadv.
Please contact us for more information.