RM 1000 PV

Reflectometer for the thickness measurement of films on textured silicon solar cells

Spectral range: 430 - 930 nm

The reflectometer RM 1000 PV measures the film thickness of antireflective coatings on textured multicrystalline and monocrystalline silicon solar cells. The spectral position of the coated wafer's reflection minimum can be determined.

The specular reflection is measured in the VIS-NIR spectral range between 430 and 930 nm wavelength. Reflectance values down to 0.001 can be analyzed. A special software allows the fitting of the measured reflection spectra and determines the thickness of the antireflective films.

Specifications:

Please see also specs of RM 1000.

Please contact us for more information.