Metallurgy

Sheet metals require a thin surface film to avoid surface corrosion between production and further processing later. These days, the measurement of the thickness of these films requires ellipsometric methods.
 
SE 400advLaser ellipsometer SE 400advanced
  • Highly sensitive detection and stabilized compensator measurement combined with depolarization correction allows the analysis of films on rough surfaces.
  • Measurement of film thickness and refractive index (e.g. alumina films on sprayed aluminum)
 
Laser ellipsometer SE 400 B
  • Fast and reliable thickness measurement of oxide films on rough sheet metal plates using the SE 400 STA
  • Typical film thickness 40 –60 nm
  • Automated measurement
  • Use in typical production environment