Corporate News
05/18/2010More than 200 laser ellipsometers sold to PV industry
SENTECH sold more than 200 laser ellipsometer SE 400adv PV in the photovoltaic industry. Laser ellipsometer SE 400adv PV measures the thickness and refractive index of SiNx antireflection coatings on textured multi-crystalline and mono-crystalline silicon solar cells. Highly sensitive detection, special optics for the collection of reflected light and the consideration of the depolarization effect are the key features which make the SE 400adv PV a leading metrology tool for quality control in production.
Please contact us if you want to get more information. We have available equipment in our demo lab, to demonstrate its measurement of thin films from your own samples.