Ingot and Brick Mapping System
The MDPingot is designed for electrical characterisation by mapping of bricks (or wafers) with measurement times of less than four minutes for a 500 mm brick at 1 mm resolution. Completely contactless measurements.
The MDPingot tool series features a robust design for quick, flexible mapping of multicrystalline silicon bricks and wafers. Simultaneous measurement of minority carrier lifetime, photoconductivity, resistivity and sample flatness, all maps at the same time. Setup of this tool is very easy only power is needed. All measurement necessities including workstation with database are included. Sample loading can be done manually or by a robot system. Measurement speed of less than four minutes for a 156 x 156 x 400 mm standard brick at 1 mm resolution. Resistivity mapping option comes with long time stability without frequent recalibration. Calibration sets for reference measurements are available as well. Spatial resolved measurement of conduction type transformations due to segregation and over compensation of the intended doping type can be investigated for the first time with a high spatial resolution.
Those tools are designed for quality monitoring of processes and materials such as mono or polycrystalline silicon. Automated output of cut criteria for poly silicon bricks. Enables individual furnace monitoring, optimisation and investment decisions based on furnace output quality. MDPingot is a standard tool tor multicrystalline silicon brick producers as well as for furnace technology producers.
- Stand alone tool series for offline brick or wafer characterisation. Simultaneous mapping of minority carrier lifetime, photoconductivity, resistivity, p/n conduction type change and geometrical sample flatness.
- Measurement speed of less than four minutes for a 156 x 156 x 400 mm standard brick at 1 mm resolution, all five maps at the same time.
- Robust design and easy setup heavy duty performance. For setup only a power cord is needed. Workstation with database is included in the underneath compartment.