Spectroscopic reflectometers RM 1000 and RM 2000
Push the limits for refractive index measurements
Our reflectometers feature most accurate single beam reflectance measurements by height and tilt adjustment Accurate height and tilt adjustment of samples using ACT functionality of sample and high light conductance of optical layout allow repeatable measurements of n and k, measurements on rough surfaces as well as thickness measurements of very thin films.
UV to NIR spectral range
RM 1000 430 nm – 930 nm
RM 2000 200 nm – 930 nm
High resolution mapping
The reflectometers RM 1000 and RM 2000 can optionally be equipped with an x‑y mapping stage and mapping software, objective lens for small spot size, and a video camera.
The spectroscopic reflectometers RM 1000 and RM 2000 measure reflectance of flat or curved samples with smooth or rough surface. Thickness, extinction coefficient, and refractive index of single films or layer stacks are calculated using SENTECH FTPadv Expert software. Single films between
The RM 1000 and RM 2000 represent high end SENTECH reflectometers. The table top device comprises the highly stabilized light source, the reflection optics with auto-collimating telescope and microscope, the height and tilt adjustable sample platform, the spectral photometer, and the power supply. It can be optionallyOptions:
(up to 200 x 200 mm2) Second objective lens SpectraRay/3 software PC equipped with an x‑y mapping stage and mapping software, objective lens for a second spot size, and a video camera.
Besides film thickness and optical constants, the composition of films (
The comprehensive, recipe oriented FTPadv EXPERT software for our reflectometers
The comprehensive, recipe oriented FTPadv EXPERT software for