Crystalline Silicon Solar Cells
The SENperc PV is the innovative solution for quality control in PERC cell manufacturing. The SENperc PV measures Al2O3/SiNx layer stacks and single films for passivation of PERC cells. The stability of the deposition process is monitored. Thereby, maintenance intervals can be optimized. Details for SENperc PV here!
The SE 400adv PV is the globally used standard tool for determining thickness and refractive index of single layer antireflective coatings for PV. Especially SiNx AR single films on textured monocrystalline and multicrystalline silicon solar cells can be characterized. Systems are used for quality control of SiNx coatings and thin passivation layers of SiO2 and Al2O3. Details for SE 400adv PV here!
SENTECH designed the SE 800 PV for characterizing multilayers composed of SiNx / SiO2, SiNx / SiNy, or SiNx / Al2O3 as passivation and antireflective coatings. Refractive index, absorption and film thickness of the stacked layers are analysed on textured monocrystalline and multicrystalline silicon solar cells. The complex measurement is performed in the recipe mode, fast and easily. Details for SE 800 PV here!