Ellipsometers, Reflectometers

Ellipsometers and Reflectometers for Research and Development

SENresearch

Spectroscopic Ellipsometers


SENresearch UV-VIS-NIR spectroscopic ellipsometer family

SENDIRA FT-IR ellipsometer

SENpro cost effective spectroscopic ellipsometer

 

SE 400adv

Laser Ellipsometers and CER


SE 400adv multiiple angle laser ellipsometer 

SE 500adv combined ellipsometry and reflectometry CER 

LaserPro most cost effective laser ellipsometer 

 

FTPadvanced 

Reflectometers


FTPadvanced - Film Thickness Probe 

RM 1000 reflectometer

RM 2000 reflectometer

 
 
Ellipsometers and Reflectometers for Industrial Quality Control

SE 400adv PV

SE 400adv PV  Laser ellipsometer for Si wafer based solar cells


Measures thickness and refractive index of anti-reflection coatings on textured multicrystalline and monocrystalline solar cells

 

SENDURO

SENDURO® - automated spectroscopic ellipsometer for industrial applications

 

SE 800 GSSE 800 GS - automated spectroscopic ellipsometer for layers on large glass panels

Measures: Thickness of single films and layer stacks, optical constants

 

Horizonzal measuring system

Automatic horizontal measuring system for thin film solar cells


Measurement platform for R, T, H, Wsq
 

FTPadvanced Inline

FTPadvanced Inline 


Multiple sensor reflectometer for inline measurements on thin film PV cells