Spectroscopic ellipsometer family SENresearch

Widest spectral range
The SENresearch ellipsometer family covers the widest spectral range
from
Step Scan Analyzer principle:
The Step Scan Analyzer principle is a unique feature of the SENTECH ellipsometer family. During data acquisition, polarizer and wide band compensator are fixed to provide highest accuracy of the ellipsometric measurement.
The SENresearch measures thin film thickness, refractive index, extinction coefficient, and related properties of bulk materials, single layers, and multi‑layer stacks. Isotropic and anisotropic materials, surface and interface roughness as well as gradients can be analyzed. Furthermore, SpectraRay/3, SENTECH proprietary ellipsometer software, treats sample effects like depolarization, non-uniformity, scattering (Mueller-matrix), and backside reflection.
The SENresearch represents the high end of SENTECH ellipsometers. The compact table top instrument comprises the ellipsometer optics, goniometer, sample platform, auto-collimating telescope, light source, and detection unit. It can be extended by a variety of options
Options:
Spectral ranges
Automated goniometer
Microspot
Mapping stages
(50x50 – 300x300 mm)
Autofocus, -alignment
Video camera
Reflectometer
Sample cells
Heating stage
Cryostat
for any
The SENresearch is focused on speed and accuracy for insitu and exsitu measurements of thin films wherever they are applied. Applications range from measuring on textured surfaces to determining the conductivity of TCO films, from insitu monitoring of deposition processes to offline mapping on large glass panels. With the latest development launched by SENTECH, magneto‑optical
Spectral generalized magneto-optical ellipsometer – combined Kerr spectroscopy, MOKE, and spectroscopic ellipsometry properties can be characterized. For a large variety of applications
Applications in:
R&D
Nanotechnology
Photovoltaics
Microelectronics
Optoelectronics
Organic electronics
Glass coatings
Display technology
Bioscience
Life science
predefined recipes are offered by SpectraRay/3.
SpectraRay/3
SENTECH's proprietary ellipsometer software SpectraRay/3 comprises two modes of operation: recipe mode and interactive mode. The recipe mode
SpectraRay/3 recipe mode: Recipe selection allows for easy execution of repetitive applications. In interactive mode
SpectraRay/3 interactive mode: Modeling, ellipsometric measurements are enhanced by an interactive, guiding graphical user interface.
Large materials database and all applicable dispersion models are included. Multiple angle of incidence, multiple sample, and combined photometric measurements are supported by SpectraRay/3.
SpectraRay/3
SENTECH's proprietary ellipsometer software SpectraRay/3 comprises two modes of operation: recipe mode and interactive mode. The recipe mode
SpectraRay/3 recipe mode: Recipe selection allows for easy execution of repetitive applications. In interactive mode
SpectraRay/3 interactive mode: Modeling, ellipsometric measurements are enhanced by an interactive, guiding graphical user interface.
Large materials database and all applicable dispersion models are included. Multiple angle of incidence, multiple sample, and combined photometric measurements are supported by SpectraRay/3.


