SpectraRay II
SpectraRay - SENTECH’s comprehensive software for spectroscopic ellipsometry includes a large integrated package of modeling, simulation, and fit programs in order to support customers for successfully processing even of complex tasks.
SpectraRay supports multi-angle, multi-experiment and combined photometric data analysis. It includes a large data library and an extended number of dispersion models to describe the dielectric function of almost all materials.
The operation of the software is very intuitive and satisfies the demands for ease of use and multiple user operation. The scripting capability makes it very flexible to automate routine measurements, to tailor it for dedicated applications and to control third party hardware like sensors, heaters or a cryostat.
The operation of the software is very intuitive and satisfies the demands for ease of use and multiple user operation. The scripting capability makes it very flexible to automate routine measurements, to tailor it for dedicated applications and to control third party hardware like sensors, heaters or a cryostat.
Key Features:
- Allows to do multi-angle, multi-experiment and combined photometric data analysis
- Measures ellipsometric, reflection, transmission, depolarization, anisotropic and Mueller Matrix data types
- Dispersion models for all kind of materials
- Large continuously updated material library
- Comprehensive simulation capabilities for all kind of ellipsometric, reflection and transmission, depolarization, anisotropy and color data types as function of wavelength, energy, angle of incidence and other model parameters
- Extended reporting functions for measured data and measured spectra as web report, ASCII file, graphic representation, all data can easily be transferred to other Windows applications
SpectraRay is especially developed to described complex properties of real world samples. These properties are:
- Composition of materials
- Graded optical properties of materials, vertical and horizontal to the film surface
- Rough surface and interfaces between two materials
- Non-uniformities (thickness, optical properties)
- Anisotropy (uniaxial and biaxial)
- Charge carrier concentration and mobility
- Periodic layer stack and layer stacks with practical unlimited number of films
Please contact us for more information.