Software

SpectraRay II

SENTECH’s comprehensive software for spectroscopic ellipsometry for leading edge applications.


SpectraRay II - Anisotropy

SENTECH's anisotropic sample analysis software for spectroscopic ellipsometry.


Simulation

Most comprehensive software for laser ellipsometers to simulate complex layer stacks at one wavelength. It allows for the modeling and fitting of multi-angle measurements at one wavelength on complex sample structures.