Ellipsometers and Reflectometers for Photovoltaics
SE 400adv PV - laser ellipsometer for Si wafer based solar cells, measures AR coatings on textured solar cells
SE 800 PV - spectroscopic ellipsomete, measures single films and layer stacks on textured silicon solar cells
RM 1000 - Reflectometer, measures film thickness of AR coatings on textured solar cells
FTPadv Inline - Measurement system for inline monitoring of thin film solar cell production
SenSol M - Manual mapping system with multiple sensor platform for thin film solar cells
SenSol H - Horizontally configured computer controlled mapping system with multiple sensor platform
SenSol V - Vertically configured computer controlled mapping system with multiple sensor platform