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07/10/2008More than 70 laser ellipsometers sold to PV industry
SENTECH proudly announces the 77th order of a laser ellipsometer SE 400 PV for the photovoltaic industry. The laser ellipsometer SE 400adv PV measures thickness and refractive index of SiNx antireflection coatings on textured multi-crystalline and mono-crystalline silicon solar cells. Very high sensitivity, special optics for the collection of reflected light and the consideration of depolarization effects are key features which make the SE 400adv PV a leading metrology tool for quality control in production.
Please contact us if you want to get more information. We have equipment available in our demo lab, in order to demonstrate the performance of thin film measurements on your own samples.