Product News

SENTECH launched the new SenSol measurement systems (M, H, V) for R&D and quality control in production of thin film solar cells. The multiple sensor platform of the SenSol can accommodate sensors for optical sheet resistance measurement, 4 point probe sensors and eddy current sensors for sheet resistance of TCO layers and sonsors for T,R,H of transparent and absorbing layers. The SenSol is aimed at thin film solar cell metrology on large glass panels for production and R&D.

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