Product News
Product News
July 2008
07/23/2008
SENDIRA with Thermo FT-IR (6700) SENTECH adapted the new infrared spectroscopic ellipsometer SENDIRA to a THERMO FT-IR (6700). read on ...
SENDIRA with Thermo FT-IR (6700) SENTECH adapted the new infrared spectroscopic ellipsometer SENDIRA to a THERMO FT-IR (6700). read on ...
07/14/2008
New products for thin film solar cells SENTECH launched the new SenSol measurement systems (M, H, V) for R&D and quality read on ...
New products for thin film solar cells SENTECH launched the new SenSol measurement systems (M, H, V) for R&D and quality read on ...
07/14/2008
SENDURO for 300 mm wafers SENTECH delivers the first SENDURO measurement system for 300 mm silicon wafer applications. The read on ...
SENDURO for 300 mm wafers SENTECH delivers the first SENDURO measurement system for 300 mm silicon wafer applications. The read on ...