Fast Ingot Mapping System
The MDPinline ingot is the state of the art system for topographic electrical characterisation of multicrystalline bricks in fabs with high throughput. Total measurement times of less than two minutes at 1 mm resolution, two brick sides simultaneously.
The MDPinline ingot systems are worldwide the fastest measurement tools available for electrical characterisation of multicrystalline silicon bricks. They are designed for single brick investigation in high throughput production fabs. Every brick can be measured on two sides in less than two minutes all maps at the same time. Measurement parameters are lifetime and conduction type equivalent maps with 1 mm resolution as well as resistivity linescans.
The system includes a database and statistical data evaluation which can be used for automated determination of precise cut positions for yield improvement, for material quality monitoring and for furnace selection and process improvement.
- World record speed for inline multicrystalline silicon brick characterisation for advanced PV fabs. Measurement of carrier lifetime with one millimeter resolution in less than two minutes at two brick sites. Spatial resolved measurement of conduction type changes as well as resistivity linescans are measured at the same time.
- Customer defined brick cut criteria can be transmitted to the fab database which allows a fully automated material monitoring for next generation photovoltaic fabs. Enables material quality control and monitoring of furnace performance, and failure analysis.
- Special “underneath the surface” measurement technique reduces distortion of data by surface recombination considerably.