Photovoltaics
The measurement of thickness and refractive index of AR coatings on multicrystalline and textured crystalline silicon solar cells are a challenge because of rough surface of substrates. SENTECH’s laser ellipsometer is the only instrument can do the job on each kind of surface morphology very well.
Another application is the thickness measurement of rough transparent electrodes (e.g. TCO) for fhin film solar cells on glass substrates.
Another application is the thickness measurement of rough transparent electrodes (e.g. TCO) for fhin film solar cells on glass substrates.
Laser ellipsometer SE 400advanced
- Highly sensitive detection and stabilized compensator measurement combined with depolarization correction and special optics allow to analyze films on rough surfaces.
- Measurement of film thickness and refractive index of SiNx on silicon solar cells
Film Thickness Probe FTPadvanced attached to large sample platform
- Fast and accurate thickness measurement of smooth and rough films on large glass substrate
- Manual and motorized sample platforms available
Fully automated table top measurement tool SENDURO
- Off-line monitoring of film thickness and refractive index of single films and layer stacks on solar silicon
- Measurement of vertical and lateral uniformity of sputtering processes